Secondary Ion Mass Spectroscopy of Zinc Selenide Crystals with Photoconductivity Spectral Memory

dc.contributor.authorКовальов, Леонід Євгенійович
dc.date.accessioned2017-02-15T13:32:55Z
dc.date.available2017-02-15T13:32:55Z
dc.date.issued2017
dc.description.abstractThe main aim of this work was to study the composition of impurities in high-resistivity ZnSe samples possessing the phenomenon of spectral memory of the photoconductivity in order to detect traces of iron impurities by the method of secondary ion mass spectroscopy (SIMS).uk_UA
dc.identifier.citationBelenchuk, A.V., Ilyinykh, N.I. & Kovalev, L.E. Secondary Ion Mass Spectroscopy of Zinc Selenide Crystals with Photoconductivity Spectral Memory. Russ. Phys. J., Vol. 59, No. 10, 1718-1720 (2017)uk_UA
dc.identifier.issn1064-8887; 1573-9228
dc.identifier.urihttp://lib.udau.edu.ua/handle/123456789/5209
dc.language.isoenuk_UA
dc.publisherSpringer USuk_UA
dc.subjectzinc selenideuk_UA
dc.subjectphotoconductivityuk_UA
dc.subjectmass spectroscopyuk_UA
dc.titleSecondary Ion Mass Spectroscopy of Zinc Selenide Crystals with Photoconductivity Spectral Memoryuk_UA
dc.typeСтаттяuk_UA
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